Hidden defect causes
Defect causes hide across thousands of process variables, so yield loss is hard to trace.
Manufacturing and semiconductors
AI for manufacturing that ships.
Higher yield, less downtime. Led by an engineer who spent years inside Micron and Intel.
Book a scoping callThe pressure
Three pressures on every plant.
01
Yield loss
Expensive and hard to trace. The cause hides among thousands of process variables.
02
Unplanned downtime
Downtime stops the line. Every idle hour is lost output.
03
Retiring knowledge
Experienced operators leave and take their know-how with them.
Use cases
Six systems we build for manufacturing.
From yield analytics to operator assistants, we build AI systems that raise yield, cut downtime and keep plant know-how on the line.
Book a scoping call
Yield analytics
Models that trace yield loss to its source, across every process step and tool.
Higher yield, faster root cause
Track yield and time to root cause to measure how quickly losses are found and fixed.
CAPABILITIES USED
AI capabilities for manufacturing
We combine predictive models, computer vision, knowledge search and data platforms to raise yield, cut downtime and keep plant know-how on the line.
01
{`Predictive and optimisation models `}
Trace yield loss, anticipate equipment failures and tune process settings with data-driven models.
02
{`Computer vision `}
Inspect parts and wafers on the line to catch defects early and consistently.
03
{`Knowledge search and assistants `}
Turn procedures, maintenance logs and old manuals into cited, searchable answers for operators.
04
Data and AI platforms
Connect sensor, process and ERP data into one governed platform your models can run on.
01
{`Predictive and optimisation models `}
Trace yield loss, anticipate equipment failures and tune process settings with data-driven models.
02
{`Computer vision `}
Inspect parts and wafers on the line to catch defects early and consistently.
03
{`Knowledge search and assistants `}
Turn procedures, maintenance logs and old manuals into cited, searchable answers for operators.
04
Data and AI platforms
Connect sensor, process and ERP data into one governed platform your models can run on.
AI Strategy
Rules we build to
We design for quality standards such as ISO 9001 and IATF 16949, industrial security standards such as IEC 62443, export control rules and your own process qualification.
ISO 9001IATF 16949IEC 62443Export controlProcess qualification